Semiconductor & Data Storage

Get to market and ramp to volume, with higher yields. Faster.

For semiconductor labs, and for fabs and labs in the data storage and MEMS markets, users can get to data faster, with the world's finest, most flexible suite of integrated imaging and analysis tools from FEI. Getting higher-quality data, faster, speeds up time-to-market and time-to-volume, while enhancing yields.

As process geometries shrink, the demands mount to increase yield, reduce cost, and accelerate time to volume. The need to adopt new tools and methodologies for finding and analyzing structures and defects is urgent, and reliable, high-quality 3D characterization and metrology are critical.

Critical process data should be available in hours, not days. The superior products, quality of results and technology leadership from FEI can be trusted to help electronics companies accelerate their efforts to get to market and ramp to volume, with higher yields. Faster.

Applications

Learn more about semiconductor and data storage applications typically performed with FEI systems and tools:

• Circuit Edit 
• 3D Metrology 
• Defect Analysis 
• Failure Analysis 

Specialty Tools

Browse FEI tools specially designed for semiconductor, data storage, and MEMS applications:

• Imago LEAP™ Atom Probe 
• PTM 600™ CD SEM System 
• Certus-3D™ 
• NanoLift™
• CLM-3D™
• Altura™ 855
• Defect Analyzer™ 300 HP
• Expida™ Family 
• V600 Family 
• Magma Design Automation