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Accura 850 Product Data
The AccuraTM 850 is an advanced focused ion beam (FIB) mask repair system designed for repairing defects on today’s most complex masks including chrome, phase shift, alternating phase shift, and optical proximity correction (OPC) feature masks. This system enables advanced masks to get to product...
Focused ion beam milling: A method of site-specific sample extraction for microanalysis of Earth and planetary materials
Argon ion milling is the conventional means by which mineral sections are thinned to electron transparency for transmission electron microscope (TEM) analysis, but this technique exhibits significant shortcomings. In particular, selective thinning and imaging of submicrometer inclusions during sa...
Nanotechnology: Your Guide to the Future of Nanotechnology
Geoffrey Sacks said in the recent BBC Reith lectures, “The fate of the planet is not a spectator sport”. He continued: “We live in an interconnected world, where all parts of the world are affected by what happens in all other parts”. All of us are increasingly aware that the pressures we are put...