Upgrades & Accessories

FEI Instruments are built to grow with you. We offer a wide range of upgrades and accessories to enhance your instrument's performance and capabilities, making your investment more flexible, extensible, and customizable. Our selection includes parts and add-ons for Scanning Electron Microscopes (SEMs), Transmission Electron Microscopes (TEMs), DualBeams™, and Focused Ion Beams (FIBs).

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Featured Additions

NanoPatterning Kit

This kit allows for full prototyping by using GDSII CAD file format and includes a 16-bit digital patterning engine. Contents: GDStoDB CAD-based FIB and beam-induced deposition FEI software, GDSII editor to create GDSII files, Extended Performance Kit for Nova NanoLab and Strata 400 (STEM).

STEM-in-ESEM Kit

This kit allows for characterization of wet/moist specimens enabling observation of the size, shape and arrangements of nanoparticles in their natural suspended state, without any sample preparation. Contents: WetSTEM Detector, Peltier/Heating Stage Control Kit if not already installed

TEM Tomography Kit

This kit allows you to get 3D volume information on a TEM sample. Contents: Tomography Holder (High Field of View), Xplore3D tomography package, Acquisition TEM and STEM software (if STEM hardware available)

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